{"id":15458,"date":"2024-08-02T09:34:07","date_gmt":"2024-08-02T07:34:07","guid":{"rendered":"https:\/\/www.ufe.cz\/research\/synthesis-and-characterization-of-nanomaterials\/laboratories\/laborator-pro-elektrickou-charakterizaci-materialu\/"},"modified":"2025-09-16T11:20:46","modified_gmt":"2025-09-16T09:20:46","slug":"laboratory-for-optoelectrical-characterization-of-materials","status":"publish","type":"page","link":"https:\/\/www.ufe.cz\/en\/research\/synthesis-and-characterization-of-nanomaterials\/laboratories\/laboratory-for-optoelectrical-characterization-of-materials\/","title":{"rendered":"Laboratory for optoelectrical characterization of materials"},"content":{"rendered":"\t\t
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The laboratory for optoelectrical characterization is equipped with different setups for the electrical characterization of semiconductor materials, devices, and structures in the temperature range of -190 to 600 \u00b0C. The electrical characterization equipment consists of Source Measure Units for current-voltage (I-V) measurements (with fA resolution), a capacitance\u2013voltage (C-V) module for AC impedance measurements, and a setup for the measurement of gas-sensing properties.<\/p>\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t

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Equipment:<\/strong><\/p>\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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Setup 1<\/strong>:<\/strong><\/p>

  • CRYO600-190-OP4-VB<\/strong> (SIMTRUM: <\/strong>Temperature Control Range from -190 to 600 \u00b0C; 4x adjustable probes; capable of fA level measurements; probe displacement accuracy- 1\u03bcm)<\/li>
  • Parameter analyzer 4200A-SCS-PKA <\/strong>(Keithley: <\/strong>3x I-V Source Measure Units; 100 fA measurement resolution; 10 aA measurement resolution with preamplifier)<\/li>
  • Tunable monochromatic light sources <\/strong>(Quantum Design: <\/strong>150 W Xe-Arc Lamp; monochromator MSZ-100)<\/li><\/ul>

    Setup <\/strong>2:<\/strong><\/p>

    • E4990A impedance analyzers <\/strong>(KEYSIGHT<\/strong>: 20 Hz-10 MHz)<\/li><\/ul>

      Setup <\/strong>3:<\/strong><\/p>

      • LN cryostat <\/strong>with cryogenic temperature controller Lake Shore <\/strong>330,340 (temperature control range from -190 to 150 \u00b0C)<\/li>
      • High-temperature probe station for the measurement of gas-sensing properties <\/strong>(SIMTRUM: <\/strong>Temperature Control Range from RT to 600 \u00b0C; 4x triaxial probes; capable of pA level measurements)<\/li>
      • Setup for the measurement of gas-sensing properties at RT (in-house designed:<\/strong> test chamber, sensor holder, and mass flow controllers MV304 and MV302)<\/li><\/ul>

        Setup <\/strong>4:<\/strong><\/p>

          • Four-point Probe Station (Ossila)<\/strong><\/li><\/ul><\/li><\/ul><\/div>\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t
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            \n\t\t\t\t\t\t\t\t\t\t\t\t\t\"\"\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<\/div>\n\t\t","protected":false},"excerpt":{"rendered":"

            The laboratory for optoelectrical characterization is equipped with different setups for the electrical characterization of semiconductor materials, devices, and structures in the temperature range of -190 to 600 \u00b0C. The electrical characterization equipment consists of Source Measure Units for current-voltage (I-V) measurements (with fA resolution), a capacitance\u2013voltage (C-V) module for AC impedance measurements, and a […]<\/p>\n","protected":false},"author":5,"featured_media":30329,"parent":15442,"menu_order":32,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_acf_changed":false,"footnotes":""},"acf":[],"_links":{"self":[{"href":"https:\/\/www.ufe.cz\/en\/wp-json\/wp\/v2\/pages\/15458"}],"collection":[{"href":"https:\/\/www.ufe.cz\/en\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.ufe.cz\/en\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.ufe.cz\/en\/wp-json\/wp\/v2\/users\/5"}],"replies":[{"embeddable":true,"href":"https:\/\/www.ufe.cz\/en\/wp-json\/wp\/v2\/comments?post=15458"}],"version-history":[{"count":0,"href":"https:\/\/www.ufe.cz\/en\/wp-json\/wp\/v2\/pages\/15458\/revisions"}],"up":[{"embeddable":true,"href":"https:\/\/www.ufe.cz\/en\/wp-json\/wp\/v2\/pages\/15442"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.ufe.cz\/en\/wp-json\/wp\/v2\/media\/30329"}],"wp:attachment":[{"href":"https:\/\/www.ufe.cz\/en\/wp-json\/wp\/v2\/media?parent=15458"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}